LASeRpapers - recent
papers of the Laser group
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Chromatic
modulation based acoustic analysis technique for in-process
monitoring of laser materials processing
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Journal
of Laser Applications 11 199-205 (1999) (ISSN 1042-346X/99/11(5)/1/7)
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J.
M. Lee, K. G. Watkins, W. M. Steen
Laser Group, Department of Engineering, University
of Liverpool Brownlow Hill, Liverpool L69 3GH, United
Kingdom
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P.
C. Russell, G. R. Jones
Centre for Intelligent Monitoring Systems, Department
of Electrical Engineering and Electronics, University
of Liverpool, Brownlow Hill, Liverpool L69 3GJ, United
Kingdom
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Abstract:
The analysis of acoustic waves produced during laser materials
processing is widely carried out for characterising, monitoring
and controlling the process. Traditional methods used
in analysing the acoustic data such as RMS signal strength
and variation analysis, frequency spectrum analysis are
based on signal intensity modulation which offers the
advantage of inherent simplicity. However, these basic
intensity monitoring systems tend to be sensitive to spurious
changes in intensity resulting from variations in the
various electrical components within the system and the
noise of the industrial environment. In addition, it is
known that the acoustic intensity is dependent on the
distance and observation angle between its source and
acoustic sensor. In this paper, a new type of acoustic
analysing method based on chromatic modulation is presented.
Chromatic modulation offers not only much more acoustic
information, precise distinction of the ambiguous signals
and robust monitoring in the laser processing system but
it could also make control of the laser process easier
by simple chromatic output factors. It is also shown in
this paper how a chromatic modulation technique may be
utilised as an acoustic analysis method to monitor the
laser cleaning process. Consequently, it was found that
the chromatic acoustic analysis method could be successfully
applied for surface monitoring in the laser cleaning process
and could provide correct monitoring information in spite
of sensor stand-off variation.
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